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2nd IEEE International Conference on Design & Test of integrated micro & nano-Systems

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https://hal-uphf.archives-ouvertes.fr/hal-03403049
Contributor : Kathleen Torck Connect in order to contact the contributor
Submitted on : Tuesday, October 26, 2021 - 8:43:14 AM
Last modification on : Wednesday, November 3, 2021 - 10:01:53 AM

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  • HAL Id : hal-03403049, version 1

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Smail Niar. 2nd IEEE International Conference on Design & Test of integrated micro & nano-Systems. Jul 2020, Hammamet, Tunisia. 2020. ⟨hal-03403049⟩

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