[Invited] Challenges to measure RF noise and intermodulation performances of mmW/THz devices

Francois Danneville (1) , Haitham Ghanem (2) , Joao Carlos Azevedo Gonçalves (3) , Sylvie Lepilliet (4) , Daniel Gloria (3) , Guillaume Ducournau (5)

1 ANODE - IEMN - Advanced NanOmeter DEvices - IEMN
2 IEMN - Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520
3 ST-CROLLES - STMicroelectronics [Crolles]
4 PCMP - IEMN - Plateforme de Caractérisation Multi-Physiques - IEMN
5 PHOTONIQUE THZ - IEMN - Photonique THz - IEMN

Applications in millimetre wave range and terahertz frequencies keep on increasing. In this context, drastic challenges are faced at measurement level, in particular to extract noise performance and nonlinear properties of devices and circuits used to build the required systems. The aim of this talk is to provide an overview of these challenges, and to describe the solutions that we have developed to respond to them.

Mots clés: mmW; THz; measurement; noise; third order intermodulation point

Domaines: Electronique

Francois Danneville, Haitham Ghanem, Joao Carlos Azevedo Gonçalves, Sylvie Lepilliet, Daniel Gloria, et al.. [Invited] Challenges to measure RF noise and intermodulation performances of mmW/THz devices. IEEE Latin American Electron Devices Conference (LAEDC 2022), Jul 2022, Cancun, Mexico. ⟨10.1109/LAEDC54796.2022.9908208⟩. ⟨hal-03791755⟩